Near-field optical microscopy

We use a SNOM (Scanning Near-field Optical Microscope) composed of a reversed Olympus 70 microscope and a near-field head from NTMDT company. This model is an aperture SNOM, based on shear-force feedback.

It is possible to perform experiments in different configurations : reflection or transmission, local collection or illumination. It can be associated with different light sources (CW laser, pulsed laser, laser diode) and/or different detection device (spectrometer, APD, PMT).

The detection system is linked to a photon counting device which allows statistical analysis of the collected photons.