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X-ray diffraction

GEMaC has an Empyrean Series 3 X-ray diffractometer from Malvern Panalytical, designed for the structural characterization of crystalline materials, whether in the form of powders, bulk samples, single crystals, or thin films deposited on a substrate.

Instrument configuration:

  • Goniometer: vertical, Bragg-Brentano configuration
  • X-ray source: copper anode (Cu, λ = 1.54 Å)
  • Hybrid incident optics: mirror + germanium (Ge) monochromator with two reflections
  • Motorized sample stage: rotations ω, 2θ, and φ, and vertical translation z.

Diffracted beam optics:

  • Automatic beam attenuator
  • 0.27° planar collimator
  • 0D xenon (Xe) proportional counter

Available techniques:

  • High-resolution X-ray diffraction (XRD): phase identification, structural and crystallographic analysis.
  • X-ray reflectivity (XRR): determination of the thickness, density, and roughness of thin films.
  • Grazing-incidence X-ray diffraction (GIXRD): study of the crystallographic properties of surfaces and thin films.
 
Empyrean Series 3 X-ray diffractometer

Goniometer